Mixed inheritance analysis for flag leaf area (FLA) was carried out using joint segregation analysis of six basic generations (P1, P2, F1, F2, B1 and B2) in two wheat crosses in 2006 to 2007 and 2008 to 2009. The results indicated that the trait was mostly under control of one major gene in combination with polygenes (model D-2) for the two crosses during the first year. However, it was controlled by mixed epistasis of two major genes plus polygenes (model E-1) in cross 2 during the second year. Transgressive segregate on both upper and lower extremity of the trait in B1, B2 and F2 indicated the presence of both favorable and reversed genes in the parents. Higher major gene heritability (9.6 to 71.0) for the trait was recorded than the polygenes heritability (4.8 to 38.9) in the segregating generations (B1, B2 and F2). Moderate to high environmental variations (14.4 to 85.0) in the trait for segregating generations revealed that FLA is influenced by the environmental fluctuations. Predominant additive effect over all other types of genetic effects suggests the delay in selection for FLA until maximum favorable genes are accumulated in the individuals.
Key words: Flag leaf area, major genes plus polygenes inheritance, Triticum aestivum L.
Copyright © 2021 Author(s) retain the copyright of this article.
This article is published under the terms of the Creative Commons Attribution License 4.0