African Journal of
Pure and Applied Chemistry

  • Abbreviation: Afr. J. Pure Appl. Chem.
  • Language: English
  • ISSN: 1996-0840
  • DOI: 10.5897/AJPAC
  • Start Year: 2007
  • Published Articles: 357

Review

Atomic force microscopy studies on sulfur-, selenium- and tellurium-based metal chalcogenide thin films: A review

Ho Soonmin
  • Ho Soonmin
  • Centre for Green Chemistry and Applied Chemistry, INTI International University, Putra Nilai, 71800, Negeri Sembilan, Malaysia.
  • Google Scholar


  •  Received: 05 October 2017
  •  Accepted: 16 November 2017
  •  Published: 30 November 2017

How to cite this article

APA /
Soonmin, H. (2017). Atomic force microscopy studies on sulfur-, selenium- and tellurium-based metal chalcogenide thin films: A review. African Journal of Pure and Applied Chemistry, 11(5), 42-49.
Chicago /
Ho Soonmin. "Atomic force microscopy studies on sulfur-, selenium- and tellurium-based metal chalcogenide thin films: A review." African Journal of Pure and Applied Chemistry 11, no. 5 (2017): 42-49.
MLA /
Ho Soonmin. "Atomic force microscopy studies on sulfur-, selenium- and tellurium-based metal chalcogenide thin films: A review." African Journal of Pure and Applied Chemistry 11.5 (2017): 42-49.