International Journal of
Physical Sciences

  • Abbreviation: Int. J. Phys. Sci.
  • Language: English
  • ISSN: 1992-1950
  • DOI: 10.5897/IJPS
  • Start Year: 2006
  • Published Articles: 2533

Full Length Research Paper

Experimental determination of layers films thicknesses

S. Ourabah1, A. Amokrane1, 2 and M. Abdesselam1
1Faculty of Physics, University of Sciences and Technology, Houari Boumediène, BP 31 El Alia, Bab Ezzouar, 16111 Algiers, Algeria. 2Preparatory National School for Engineer Studies, Rouiba, Algiers, Algeria
Email: [email protected]

  •  Accepted: 08 August 2013
  •  Published: 16 August 2013

Abstract

The determination of particle induced x-ray emission (PIXE) cross sections and the concentration of elements in a material require the knowledge of the target sample thickness. In this aim, measurements of the thickness by three different methods have been performed. These are absorption of X-rays by a 55Fe source, transmission of alpha particles by a 241Am source and Rutherford backscattering of alpha particles produced by Van de Graff Accelerator with the use of the RUMP simulation code. The results give a thickness with uncertainties ranging from 1 to 8% according to the experimental technique used. The comparison between these methods gives an advantage for the X-rays absorption for its simplicity and accuracy, when backscattering spectrometry is preferred for thin target on backing or as a complementary technique for PIXE analysis.

 

Key words: Thickness, particle induced x-ray emission (PIXE), Rutherford backscattered (RBS), cross section, rump.