International Journal of
Physical Sciences

  • Abbreviation: Int. J. Phys. Sci.
  • Language: English
  • ISSN: 1992-1950
  • DOI: 10.5897/IJPS
  • Start Year: 2006
  • Published Articles: 2557

Full Length Research Paper

Effect of an electric field within microscopy focused ion beam (FIB) between manipulator sharp and the ion trap of the electron detector

Gómez Jorge A.1, Pérez Hernández2 and A. Duarte-Moller, A.2*            
1Instituto Potosino de Investigación Científica y Tecnológica, Camino a la Presa San José 2055. Col. Lomas 4 sección CP. 78216, México. 2Centro de Investigación en Materiales Avanzados Chihuahua, Miguel de Cervantes Saavedra No. 120, Complejo Industrial Chihuahua, Chihuahua, Chih., México  
Email: [email protected].

  •  Accepted: 15 July 2011
  •  Published: 02 October 2011

Abstract

The manipulation of samples with micro manipulators sharps in the normal axis to the observation plane is practically blind in microscopy focused ion beam (FIB) mono beam. The application of a negative potential to the manipulator sharp has been considered, which causes differences of electrical potential between the detector and the sample holder, generating an electric field between the sharp and the sample. This makes the electrons, aside the sample, undergo a greater deflection, reflecting in poorer contrast image. This deflection depends on a great extension of the sample holder height between the micromanipulator sharp, voltage deflector, q/m electron factor and electron acceleration.

 

Key words: Focused ion beam (FIB) mono beam, contrast effects, electric fields, height.

Copyright © 2023 Author(s) retain the copyright of this article.

This article is published under the terms of the Creative Commons Attribution License 4.0

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