Scientific Research and Essays

  • Abbreviation: Sci. Res. Essays
  • Language: English
  • ISSN: 1992-2248
  • DOI: 10.5897/SRE
  • Start Year: 2006
  • Published Articles: 2754

Full Length Research Paper

Failure model and detecting method for MOSFET degradation in DC-DC power converters

Li-Feng Wu
  • Li-Feng Wu
  • College of Information Engineering, Capital Normal University, Beijing 100048, China.
  • Google Scholar
Peng-Fei Dong
  • Peng-Fei Dong
  • Beijing Engineering Research Center of High Reliable Embedded System, Capital Normal University, Beijing 100048, China.
  • Google Scholar
Yong Guan
  • Yong Guan
  • Beijing Key Laboratory of Electronic System Reliable Technology, Capital Normal University, Beijing, 100048 China.
  • Google Scholar
Guo-Hui Wang
  • Guo-Hui Wang
  • College of Information Engineering, Capital Normal University, Beijing 100048, China.
  • Google Scholar
Xiao-Juan Li
  • Xiao-Juan Li
  • Beijing Key Laboratory of Electronic System Reliable Technology, Capital Normal University, Beijing, 100048 China.
  • Google Scholar


  •  Received: 02 March 2014
  •  Accepted: 28 March 2014
  •  Published: 15 April 2014

Authors

Li-Feng Wu
College of Information Engineering, Capital Normal University, Beijing 100048, China.

Peng-Fei Dong
Beijing Engineering Research Center of High Reliable Embedded System, Capital Normal University, Beijing 100048, China.

Yong Guan
Beijing Key Laboratory of Electronic System Reliable Technology, Capital Normal University, Beijing, 100048 China.

Guo-Hui Wang
College of Information Engineering, Capital Normal University, Beijing 100048, China.

Xiao-Juan Li
Beijing Key Laboratory of Electronic System Reliable Technology, Capital Normal University, Beijing, 100048 China.

Corresponding Author Email: [email protected]