Scientific Research and Essays

  • Abbreviation: Sci. Res. Essays
  • Language: English
  • ISSN: 1992-2248
  • DOI: 10.5897/SRE
  • Start Year: 2006
  • Published Articles: 2758

Full Length Research Paper

Failure model and detecting method for MOSFET degradation in DC-DC power converters

Li-Feng Wu
  • Li-Feng Wu
  • College of Information Engineering, Capital Normal University, Beijing 100048, China.
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Peng-Fei Dong
  • Peng-Fei Dong
  • Beijing Engineering Research Center of High Reliable Embedded System, Capital Normal University, Beijing 100048, China.
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Yong Guan
  • Yong Guan
  • Beijing Key Laboratory of Electronic System Reliable Technology, Capital Normal University, Beijing, 100048 China.
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Guo-Hui Wang
  • Guo-Hui Wang
  • College of Information Engineering, Capital Normal University, Beijing 100048, China.
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Xiao-Juan Li
  • Xiao-Juan Li
  • Beijing Key Laboratory of Electronic System Reliable Technology, Capital Normal University, Beijing, 100048 China.
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  •  Received: 02 March 2014
  •  Accepted: 28 March 2014
  •  Published: 15 April 2014

References

 
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Braham A, Lahyani A, Venet P, Rejeb N (2010). Recent Developments in Fault Detection and Power Loss Estimation of Electrolytic Capacitors. IEEE T Power Electr. 25(1):33-43.
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Celaya JR, Saxena A, Kulkarni CS, Saha S, Goebel K (2012). Prognostics approach for power MOSFET under thermal-stress aging. Reliability and Maintainability Symposium (RAMS), 2012 Proceedings – Annual. Date of Conference Jan. 2012.1-6.
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Chen Y (2010). Practical simulation and testing technology of switching converter. Beijing: China Machine Press.
 
Ginart A, Roemer MJ, Kalgren PW, Goebel K (2008). Modeling Aging Effects of IGBTs in Power Drives by Ringing Characterization. In Proceedings of the International Conference on Prognostics and Health Management, Denver, CO, USA, 6–9 October, pp. 1-7.
 
Oukaour A, Tala-Ighil B, Pouderoux B (2011). Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition. Microelectr. Reliab. 51:386-391.
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Pang HM, Bryan Pong MH (2010). A life prediction scheme for electrolytic capacitors in power converters without current sensor. Proceedings of IEEE Applied Power Electronics Conference and Exposition- APEC: pp. 973-979.
 
Rosas-Caro JC, Garcia-Vite PM, Lozano-Garcia JM, Gonzalez-Rodriguez A, Castillo-Gutierrez R, Castillo-Ibarra R (2012). Generalized DC-DC multiplier converter topology. IEICE Electron. Exp. 9(19):1522-1527.
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Rosas-Caro JC, Ramirez JM, Peng FZ, Valderrabano A (2010). A DC-DC multilevel boost converter. IET Power Electron. 3(1):129-137.
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Smet V, Forest F, Huselstein J (2011). Ageing and failure modes of IGBT modules in high-temperature power cycling. IEEE Trans. Industr. Electr. 58:4931-4941.
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Sun F, Wang Y, Cui J, Lin H (2010). Research on failure prediction method of electrolytic capacitor used in power conversion circuit. J. Electr. Mater. Instr. 24(1):29-33.
 
Wu L, Zheng Y, Guan Y, Wang G, Li X (2014). A Non-intrusive method for the degradation of MOSFETs monitoring. Sensors 14(1):1132-1139.
Crossref

 

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