Full Length Research Paper
References
Azoui T, Tounsi P, Dupuy P (2011). 3D Electro-thermal modeling of bonding and metallization ageing effects for reliability improvement of power MOSFETs. Microelectron. Reliab. 51:1943-1947. Crossref |
||||
Braham A, Lahyani A, Venet P, Rejeb N (2010). Recent Developments in Fault Detection and Power Loss Estimation of Electrolytic Capacitors. IEEE T Power Electr. 25(1):33-43. Crossref |
||||
Celaya JR, Saxena A, Kulkarni CS, Saha S, Goebel K (2012). Prognostics approach for power MOSFET under thermal-stress aging. Reliability and Maintainability Symposium (RAMS), 2012 Proceedings – Annual. Date of Conference Jan. 2012.1-6. Crossref |
||||
Chen Y (2010). Practical simulation and testing technology of switching converter. Beijing: China Machine Press. | ||||
Ginart A, Roemer MJ, Kalgren PW, Goebel K (2008). Modeling Aging Effects of IGBTs in Power Drives by Ringing Characterization. In Proceedings of the International Conference on Prognostics and Health Management, Denver, CO, USA, 6–9 October, pp. 1-7. | ||||
Oukaour A, Tala-Ighil B, Pouderoux B (2011). Ageing defect detection on IGBT power modules by artificial training methods based on pattern recognition. Microelectr. Reliab. 51:386-391. Crossref |
||||
Pang HM, Bryan Pong MH (2010). A life prediction scheme for electrolytic capacitors in power converters without current sensor. Proceedings of IEEE Applied Power Electronics Conference and Exposition- APEC: pp. 973-979. | ||||
Rosas-Caro JC, Garcia-Vite PM, Lozano-Garcia JM, Gonzalez-Rodriguez A, Castillo-Gutierrez R, Castillo-Ibarra R (2012). Generalized DC-DC multiplier converter topology. IEICE Electron. Exp. 9(19):1522-1527. Crossref |
||||
Rosas-Caro JC, Ramirez JM, Peng FZ, Valderrabano A (2010). A DC-DC multilevel boost converter. IET Power Electron. 3(1):129-137. Crossref |
||||
Smet V, Forest F, Huselstein J (2011). Ageing and failure modes of IGBT modules in high-temperature power cycling. IEEE Trans. Industr. Electr. 58:4931-4941. Crossref |
||||
Sun F, Wang Y, Cui J, Lin H (2010). Research on failure prediction method of electrolytic capacitor used in power conversion circuit. J. Electr. Mater. Instr. 24(1):29-33. | ||||
Wu L, Zheng Y, Guan Y, Wang G, Li X (2014). A Non-intrusive method for the degradation of MOSFETs monitoring. Sensors 14(1):1132-1139. Crossref |
Copyright © 2023 Author(s) retain the copyright of this article.
This article is published under the terms of the Creative Commons Attribution License 4.0