International Journal of
Physical Sciences

  • Abbreviation: Int. J. Phys. Sci.
  • Language: English
  • ISSN: 1992-1950
  • DOI: 10.5897/IJPS
  • Start Year: 2006
  • Published Articles: 2572

Full Length Research Paper

Study on the morphology of polyacrylamide – silica fumed nanocomposite thin films

Mukhles Sowwan1, Maryam Faroun1, Ishaq Musa1, Imad Ibrahim1, Sami Makharza1, Wadie Sultan2 and Hasan Dweik2
1The Nanotechnology Research laboratory, Materials Engineering Department, Al-Quds University, East Jerusalem- Palestine. 2Department of Chemistry, Al-Quds University, East Jerusalem-Palestine.
Email: [email protected]

  •  Accepted: 28 May 2008
  •  Published: 30 June 2008

Abstract

Silica fumed nanoparticles were dispersed in polyacrylamide thin films by direct mixing. Atomic Force Microscopy study was carried out in order to analyze the surface roughness. Height distribution of surface roughness changes from Gaussian like for polyacrylamide to skew asymmetric when increasing the silica concentration. The length of the distribution tail increases, indicating the formation of multi-scale features that increase in number and size, as the silica increase.

 

Key words: Polyacrylamide, nanocompsite, surface roughness, AFM.

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This article is published under the terms of the Creative Commons Attribution License 4.0

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