Zinc oxide (ZnO) thin films were deposited by chemical spray pyrolysis (CSP) technique using zinc acetate dihydrate solutions on microscopic glass substrates by varying the precursor concentration. The prepared films were characterized structurally and optically, using the powder X-ray diffraction (XRD) and UV analysis and Photoluminescence analysis. Crystallographic properties were analyzed through powder XRD. The XRD patterns shows a hexagonal structure with c-axis orientation (0 0 2) on self texturing phenomenon. Optical transmittance properties of the optimized ZnO thin films were investigated by using UV-Vis spectroscopy. The optical studies predicated a maximum transmittance in the range of above 70% with direct band gap values in the range of 2.9 to 3.2eV for the zinc oxide thin films. Under excitation of 300 nm radiations, sharp deep level emission peak at 2.506 eV dominates the photoluminescence spectra with weak deep level and near band edge emission peak at 3.026 and 3.427 eV respectively.
Key words: Transparent conducting oxide (TCO), Zinc Oxide thin film, CSP technique, X-ray diffraction (XRD), UV-Vis, Photoluminescence.