X-ray photoelectron spectroscopy and atomic force microscopy studies on crosslinked chitosan thin film

W. F. Yap; W. M. M. Yunus; Z. A. Talib; N. A. Yusof

doi:10.5897/IJPS11.121

International Journal of
Physical Sciences

Abbreviation: Int. J. Phys. Sci.
Language: English
ISSN: 1992-1950
DOI: 10.5897/IJPS
Start Year: 2006
Published Articles: 2572

Full Length Research Paper

X-ray photoelectron spectroscopy and atomic force microscopy studies on crosslinked chitosan thin film

W. F. Yap1*, W. M. M. Yunus1, Z. A. Talib1 and N. A. Yusof2

1Department of Physics, Faculty of Science, University Putra Malaysia, 43400 UPM Serdang, Selangor, Malaysia. 2Department of Chemistry, Faculty of Science, University Putra Malaysia, 43400 UPM Serdang, Selangor, Malaysia.
Email: [email protected]

Article Number - 1BC689723473
Vol.6(11), pp. 2744-2749 , June 2011
https://doi.org/10.5897/IJPS11.121

Accepted: 11 April 2011
Published: 04 June 2011

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