Automated surface micro flaw inspection for quality control of electronic chips

Hong-Dar Lin; Singa Wang Chiu

doi:10.5897/IJPS11.1431

International Journal of
Physical Sciences

Abbreviation: Int. J. Phys. Sci.
Language: English
ISSN: 1992-1950
DOI: 10.5897/IJPS
Start Year: 2006
Published Articles: 2572

Full Length Research Paper

Automated surface micro flaw inspection for quality control of electronic chips

Hong-Dar Lin1* and Singa Wang Chiu2

1Department of Industrial Engineering and Management, Chaoyang University of Technology, 168 Jifong E. Road, Wufong District, Taichung 41349, Taiwan. 2Department of Business Administration, Chaoyang University of Technology, 168 Jifong E. Road, Wufong District, Taichung 41349, Taiwan.
Email: [email protected]

Article Number - B60814B20291
Vol.6(23), pp. 5528-5539 , October 2011
https://doi.org/10.5897/IJPS11.1431

Accepted: 23 September 2011
Published: 09 October 2011

Copyright © 2024 Author(s) retain the copyright of this article.
This article is published under the terms of the Creative Commons Attribution License 4.0.