International Journal of
Physical Sciences

  • Abbreviation: Int. J. Phys. Sci.
  • Language: English
  • ISSN: 1992-1950
  • DOI: 10.5897/IJPS
  • Start Year: 2006
  • Published Articles: 2572

Full Length Research Paper

Topography measurement of nano silicon oxide film

F. M. Nakhei 1* and A. Bahari 2
1Department of Physics, Islamic Azad University, Sari Branch, Sari, Iran. 2Department of Physics, Faculty of Science, University of Mazandaran, Babolsar, Iran.
Email: [email protected], [email protected]

  •  Accepted: 07 May 2009
  •  Published: 31 May 2009

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