The mature wheat cut and uncut edge detection method based on wavelet image rotation and projection
Youchun Ding1*, Du Chen2 and Shumao Wang2
1College of Engineering and Technology, Hazhong Agricultural University, No.1, Shizishan Street, Hongshan District, Wuhan, Hubei Province, 430070, P. R. China.
2College of Engineering and Technology, China Agricultural University, No. 17# Qinhua east road, Beijin 100083, P. R. China, China.
Email: [email protected]
