African Journal of
Biotechnology

  • Abbreviation: Afr. J. Biotechnol.
  • Language: English
  • ISSN: 1684-5315
  • DOI: 10.5897/AJB
  • Start Year: 2002
  • Published Articles: 12487

Review

Genome-wide analysis of Xylella fastidiosa: implications for detection and strain relationships

Harshavardhan Doddapaneni1&4 Marta Francis2, Jiqiang Yao3, Hong Lin4, and Edwin L.  Civerolo4*  
1University of California Davis, Department of Viticulture and Enology, Davis, CA 95616, USA. 2University of California Davis, Department of Plant Pathology, Davis, CA 95616, USA. 3Citrus Research Board, 323 W. Oak, P.O. Box 230, Visalia, CA 93279, USA. 4USDA-ARS. San Joaquin Valley Agricultural Science Center, 9611 So. Riverbend  Ave, Parlier, CA 93648, USA.
Email: [email protected]

  •  Accepted: 24 October 2006
  •  Published: 18 January 2007

How to cite this article

APA /
Doddapaneni, H., Francis, M., Yao, J., Lin, H., & Civerolo, E. L. (2007). Genome-wide analysis of Xylella fastidiosa: implications for detection and strain relationships. African Journal of Biotechnology , 6(2), 055-066.
Chicago /
Harshavardhan Doddapaneni& Marta Francis, Jiqiang Yao, Hong Lin, and Edwin L.  Civerolo  . "Genome-wide analysis of Xylella fastidiosa: implications for detection and strain relationships." African Journal of Biotechnology 6, no. 2 (2007): 055-066.
MLA /
Harshavardhan Doddapaneniamp; Marta Francis, et al. "Genome-wide analysis of Xylella fastidiosa: implications for detection and strain relationships." African Journal of Biotechnology 6.2 (2007): 055-066.
DOI /
https://doi.org/10.5897/AJB06.528
URL /
https://academicjournals.org/journal/AJB/article-abstract/9FB37AE6768

Copyright © 2024 Author(s) retain the copyright of this article.

This article is published under the terms of the Creative Commons Attribution License 4.0

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