Abstract
Zinc sulphide (ZnS) thin films have been prepared by chemical bath deposition method. X-ray diffraction (XRD) is used to analyze the structure and crystallite size and scanning electron microscopy is used to study the particle size and morphology of ZnS thin film. Optical studies have been carried out using UV-Visible-NIR absorbance spectrum. The band gap value of the film is calculated and it is found to be 3.45 eV. The dielectric properties of ZnS thin films have been studied in the different frequency at different temperatures.
Key words: Zinc sulphide (ZnS) thin films, X-ray diffraction (XRD), scanning electron microscopy (SEM), dielectric studies.