International Journal of
Physical Sciences

  • Abbreviation: Int. J. Phys. Sci.
  • Language: English
  • ISSN: 1992-1950
  • DOI: 10.5897/IJPS
  • Start Year: 2006
  • Published Articles: 2572

Full Length Research Paper

Comparison of electron transport properties in submicrometer ZnS and ZnO n+nn+ diode using ensemble Monte Carlo simulation

M. R. Khalvati1*, H. Arabshahi2, M. Izadifard1, A. Mokhles Gerami3 and H. Rahimpour Soleimani3
1Department of Physics, Shahrood University of Technology, Shahrood, Iran. 2Department of Physics, Ferdowsi University of Mashhad, Mashhad, Iran. 3Department of Physics, University of Guilan, Rasht, Iran.
Email: mohammad_khalvati@yahoo. com

  •  Accepted: 14 April 2010
  •  Published: 30 June 2010

Abstract

An ensemble Monte Carlo simulation has been used for the simultaneous evaluation of the electronic steady-state transport in n+nn+ ZnS and ZnO diode. The anode voltage ranges from 0 to 4 V. Electronic states within the conduction band valleys are based on a three-valley model which are represented by nonparabolic ellipsoidal valleys centered on the important symmetry point of the first Brillouin zone. Our calculation shows that the saturation mean drift velocity for electrons in the channel of ZnO and ZnS are about 2 × 105 and 1.25 × 105  ms-1, respectively at a bias voltage of 4 V. It is shown also that the mean drift velocity in channel decrease sharply with increasing temperature in both structure and reach to saturated value about 1 × 105 and 0.6 × 105 ms-1  for ZnO and ZnS, respectively.

 

Key words: Ensemble Monte Carlo, ellipsoidal valleys, brillouin zone, drift velocity.