Pattern recognition technique for integrated circuit (IC) pins inspection using wavelet transform with chain-code-discrete fourier transform and signal correlation

Somyot Kaitwanidvilai; Anakkapon Saenthon; Anantawat Kunakorn

doi:10.5897/IJPS11.1434

International Journal of
Physical Sciences

Abbreviation: Int. J. Phys. Sci.
Language: English
ISSN: 1992-1950
DOI: 10.5897/IJPS
Start Year: 2006
Published Articles: 2572

Full Length Research Paper

Pattern recognition technique for integrated circuit (IC) pins inspection using wavelet transform with chain-code-discrete fourier transform and signal correlation

Somyot Kaitwanidvilai1,2*, Anakkapon Saenthon1,2 and Anantawat Kunakorn1

1Faculty of Engineering, King Mongkut's Institute of Technology Ladkrabang, Bangkok 10520, Thailand. 2College of Data Storage Innovation, King Mongkut's Institute of Technology Ladkrabang, Bangkok 10520, Thailand.
Email: [email protected]

Article Number - FFE16B218829
Vol.7(9), pp. 1326 - 1332 , February 2012
https://doi.org/10.5897/IJPS11.1434

Accepted: 30 January 2012
Published: 23 February 2012

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