Pattern recognition technique for integrated circuit (IC) pins inspection using wavelet transform with chain-code-discrete fourier transform and signal correlation
Somyot Kaitwanidvilai1,2*, Anakkapon Saenthon1,2 and Anantawat Kunakorn1
1Faculty of Engineering, King Mongkut's Institute of Technology Ladkrabang, Bangkok 10520, Thailand.
2College of Data Storage Innovation, King Mongkut's Institute of Technology Ladkrabang, Bangkok 10520, Thailand.
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