African Journal of
Business Management

  • Abbreviation: Afr. J. Bus. Manage.
  • Language: English
  • ISSN: 1993-8233
  • DOI: 10.5897/AJBM
  • Start Year: 2007
  • Published Articles: 4131

Technological spillovers of transferred inventors from the perspective of Social Network Analysis (SNA)

Te-Wei Lo1*, Wen-Goang Yang2, Ta-Sheng Hung3 and Kuei-Kuei Lai4
1Department of Information Management, WuFeng University, 117 Chian-Kuo Rd., Section 2, Ming-Hsiung, Chia-Yi 62153, Taiwan. 2Department of Leisure Services Management and Department of Marketing and Logistic Management, Chaoyang University of Technology, 168 Jifeng E. Rd., Wufeng District, Taichung 41349, Taiwan. 3HEP Tech Co., Ltd., 20 Jingke 7th Road, Nantun District, Taichung 408, Taiwan. 4Department of Business Administration, National Yunlin University of Science and Technology, 123 University Rd., Section 3, Douliou, Yunlin 64002, Taiwan.  
Email: [email protected]

  •  Accepted: 16 May 2011
  •  Published: 30 September 2013

Abstract

Personnel involved in high-tech R&D commonly move between enterprises, bringing with them technology obtained elsewhere. This leads to an imperceptible circulation of analogous technology among different companies. Unfortunately, this so-called technological spillover is difficult to detect. This study combined social network analysis with patent data covering nearly 30 years to construct the networks that involve the mobility of inventors and technological overlap in the Hsinchu semiconductor industry. Regression analysis using quadratic assignment procedures reveals that the network within which inventors migrate has a positive impact on the network technological overlap. Further analysis clarified the positive relationship between the mobility of inventors and technological overlap in terms of the organizational network characteristics. This confirms a process of co-evolution between technological overlap and the mobility of inventors, which may have a highly likely spillover.

 

Key words: Technological spillover, transferred inventor, social network analysis, technological overlap.