Atomic force microscopy studies on sulfur-, selenium- and tellurium-based metal chalcogenide thin films: 
A review

Ho Soonmin

doi:10.5897/AJPAC2017.0739

African Journal of
Pure and Applied Chemistry

Abbreviation: Afr. J. Pure Appl. Chem.
Language: English
ISSN: 1996-0840
DOI: 10.5897/AJPAC
Start Year: 2007
Published Articles: 368

Review

Atomic force microscopy studies on sulfur-, selenium- and tellurium-based metal chalcogenide thin films: A review

Ho Soonmin

Ho Soonmin
Centre for Green Chemistry and Applied Chemistry, INTI International University, Putra Nilai, 71800, Negeri Sembilan, Malaysia.
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Article Number - BEB18A566732
Vol.11(5), pp. 42-49 , November 2017
https://doi.org/10.5897/AJPAC2017.0739

Received: 05 October 2017
Accepted: 16 November 2017
Published: 30 November 2017

Copyright © 2024 Author(s) retain the copyright of this article.
This article is published under the terms of the Creative Commons Attribution License 4.0.

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African Journal of Pure and Applied Chemistry

Atomic force microscopy studies on sulfur-, selenium- and tellurium-based metal chalcogenide thin films: A review

Ho Soonmin

African Journal of
Pure and Applied Chemistry