Scientific Research and Essays

  • Abbreviation: Sci. Res. Essays
  • Language: English
  • ISSN: 1992-2248
  • DOI: 10.5897/SRE
  • Start Year: 2006
  • Published Articles: 2768

Full Length Research Paper

Failure model and detecting method for MOSFET degradation in DC-DC power converters

Li-Feng Wu
  • Li-Feng Wu
  • College of Information Engineering, Capital Normal University, Beijing 100048, China.
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Peng-Fei Dong
  • Peng-Fei Dong
  • Beijing Engineering Research Center of High Reliable Embedded System, Capital Normal University, Beijing 100048, China.
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Yong Guan
  • Yong Guan
  • Beijing Key Laboratory of Electronic System Reliable Technology, Capital Normal University, Beijing, 100048 China.
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Guo-Hui Wang
  • Guo-Hui Wang
  • College of Information Engineering, Capital Normal University, Beijing 100048, China.
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Xiao-Juan Li
  • Xiao-Juan Li
  • Beijing Key Laboratory of Electronic System Reliable Technology, Capital Normal University, Beijing, 100048 China.
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  •  Received: 02 March 2014
  •  Accepted: 28 March 2014
  •  Published: 15 April 2014

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